Home > Simulyzer 2.5 > Description in detail > Working with the Simulyzer > Simulation of sensors > Generation of sensor data

Generation of sensor data

The simulated sensor data can be generated by three different kinds:

1. 1. FPGA internal test pattern (saw tooth)
      

   2. External analog voltage (-10 V ... + 10 V), 12 bit transformed per timeslot.
      

   3. Individual definition of sensor data
      The data will be transmitted to sensor simulation in FPGA as isochrome data streams with a resolution of 100µs..
      At the file the data stream are given isochron or as data with a time stamp. In second case the time stamped data are converted (interpolate). Targeted error bits can be included at the test pattern file.